| Quick View Instrumentation List: |
| Agilent Technologies 5420 Atomic Force Microscope |
| Agilent Technologies Nanoindenter G200 |
| ATI Mattson Quantum FTIR Microscope |
| Brookhaven Instruments Corp. 90 Plus/BI-MAS Particle Sizer |
| Brookhaven Instruments Corp. Zeta PLUS/PALS Zeta Potential Analyzer |
| Bruker D8 Discover X-ray Diffractrometer |
| Bruker Vector 22 FTIR |
| Hewlett Packard 5950A ESCA System |
| HORIBA JOBIN YVON UVISEL Ellipsometer |
| JEOL JSM-6460LV Scanning Electron Microscope |
| Micromiritics ASAP 2020 BET Surface area/Pore size |
| Ocean Optics SD2000 UV-VIS Spectrometer |
| Olympus LEXT OLS4100 Laser Confocal Microscope |
| Perkin Elemer Phi 5450 X-ray Photoelectron Spectrometer |
| Scintag XDS 2000 X-ray Diffractometer |
| TA Instruments Q10 Differential Scanning Calorimeter |
| TA Instruments Q800 Dynamic Mechanical Analyzer |
| TA Instruments SDT2960 Thermal Gravimetric Analyzer |
| Thermo Electron S4 Atomic Absorption Spectrometer |
| TopCon SM-300 Scanning Electron Microscope |