Facilities

Research Lab Facilities

The Nanotechnology Research laboratory established by Prof. Kouklin at the College of Engineering and Applied Science, at UWM is fully equipped to accomplish a vast variety of highly sophisticated and scientifically demanding tasks in cross-linked interdisciplinary research domains, ranging from nanoscale materials fabrication and characterization to bio-nanotechnological assays. The College of Engineering also incorporates Advanced Research Facility that features additional facilities for materials characterization and research such as 3D Olympus Microscope, AFM, STM, XRD (Bruker). Additional instruments are available at Physics and Biology Departments: HRSEM and HRTEM (Hitachi), respectively. UWM faculty also have 24 / 7 access to e-beam, thermal evaporation and sputtering based deposition/etching equipment on campus.  

The laboratory hosts a vast variety of resources to fabricate, test and characterize a broad spectrum of semiconductors and nano-materials for application in nano-electro-optical, mechanical and photonic devices. This includes 2 I-V stations, AC characterization and optical components, 2 optical tables, as well as  instruments for nanofabrication and characterization, cryostat ( 10-600K) with electrical and optical access, and UV-vis-NIR Spectrophotometer with Confocal Microscope.   

Description   Model  Number 
Keithley Nanovoltmeter  2182A 
Keithley DC-AC current source  6221 
Keithley Source-Measurement Unit 

236 
Mitutoyo Research Grade Microscope  (magnification levels: 100x, 200x and 500x )    
Micromanipulator Probe Station, Micromanipulator  4000 
Micro-Positioners x 2, Micromanipulator  

220 
HP Dual DC Power Supply   6253A 
UV Optical Excitation Source (excitation wavelengths available: 254, 302 and 365 nm)   
Instek Digital Storage Oscilloscope   GPS-820S 
Sputtering reactor for metal deposition  

 
Centrifuge, Eppendorf   MiniSpin Plus 
2 in-house high-T, pressure-variable CVD-reactors  

Lyndberg, MTI 
Bruker FTIR Micro-System with ATR 

Bruker 

Digital Lock-In Amplifier, with preamplifier   Stanford Research 
Versatile Photoluminescence Measurement System with 2x grating excitation and emission spectrometers, single photon counting PMT and InGaAs liquid nitrogen cooled detectors and attached confocal Olympus Microscope with a variety of filters and objectives.  

 

 

Horriba, Jobin Yvon